@Article{	  pretschner:compositional:2003,
  abstract	= {We present a method for automatically generating tests for
		  reactive systems specified by concurrently executing
		  extended finite state machines. The generated test suites
		  satisfy the modified condition/decision coverage criterion
		  at unit and integration levels. The generation of MC/DC
		  suites for eager first-order functional programs is
		  subsumed. An industrial chip card case study illustrates
		  the approach.},
  author	= {A. Pretschner},
  journal	= {Electronic Notes in Theoretical Computer Science},
  language	= {USenglish},
  number	= 6,
  pages		= {1--11},
  title		= {Compositional Generation of MC/DC Integration Test
		  Suites},
  volume	= 82,
  year		= 2003,
  user		= {pretscha}
}